Test Background
High-temperature operating life test is one of the most common reliability testing methods, and almost all semiconductor devices will undergo this test. The high-temperature working life test of semiconductor devices uses high temperature and voltage acceleration to estimate the normal working life of the electronic device for a long time in the future through accelerated testing within a certain period of time, that is, the estimation of the life cycle of the electronic device.
Zhongke Testing Environmental Reliability Experiment Center has various mechanical and climatic test equipment for semiconductor devices, has high-temperature working life testing capabilities, and provides professional high-temperature working life testing services for semiconductor devices and equipment.
Test method
According to the corresponding life test specifications, tests are required at the beginning of the life test, at the nodes of each intermediate temporary process, and after the end of the life test. Interim and final testing can include high temperature testing. However, elevated temperature testing can only be performed after specified room temperature (and lower) testing.
After temporary testing, the bias should be loaded before the laboratory heats up or within 10 minutes of moving into the high temperature laboratory. Complete the electrical parameter test within 96 hours of removing the bias, the sooner the better. If the test encounters difficulties such as lack of instrumentation or other factors, the bias on the device should be retained, the bias stress life can be extended, or the device can be biased at room temperature until the 96h period is met.
Test standard:
GB/T 4937.1-2006 Mechanical and climatic test methods for semiconductor devices Part 1: General
GB/T 4937.23 Mechanical and climatic test methods for semiconductor devices Part 23: High temperature operating life
IEC 60749--23: 2010 Semiconductor devices - Mechanical and climatic test methods Part 23: High temperature operating life
IEC 60747 (all chapters) Semiconductor devices - Discrete devices and integrated circuits
IEC 60749-34: Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (intermittent life)
