Salt spray testing of semiconductor devices

The purpose of the salt spray test for semiconductor devices is to determine the corrosion resistance of semiconductor devices through an accelerated test that simulates the impact of harsh seaside atmosphere on the exposed surface of the device. It is suitable for devices working in sea and coastal areas and is a destructive test.
Zhongke Testing Environmental Reliability Experiment Center has various mechanical and climatic test equipment for semiconductor devices, has salt spray test capabilities, and provides professional salt spray test services for semiconductor devices and equipment.

After pretreatment, the test samples should be placed in the test chamber in a prescribed manner so that they do not touch each other, do not block each other, and can freely accept the action of salt spray. Corrosion products and agglomerates will not drip from one sample to another. The holding time of the spray in the test chamber should be carried out according to the requirements of the test conditions.
During the test, the temperature in the test chamber should be maintained at (35±2) C, and the concentration and spray speed of the salt spray should be adjusted to make the salt sedimentation rate in the test area (30±10) g/(m²·d).
When measuring at no less than 35°C, the pH value of the salt solution should be between 6.0 and 7.5 [Only chemically pure (CP grade) hydrochloric acid or sodium hydroxide (dilute solution) can be used to adjust the pH value].

GB/T 4937.1-2006 Mechanical and climatic test methods for semiconductor devices Part 1: General
GB/T 4937.13-2018 Mechanical and climatic test methods for semiconductor devices Part 13: Salt spray
IEC 60749-13: 2002 Mechanical and climatic test methods for semiconductor devices Part 13: Salt spray
IEC 60068-2-11 Environmental Test Part 2: Test Method Test Ka: Salt Spray
GB/T 2423.17- 2008 Environmental testing of electrical and electronic products Part 2: Test methods Test Ka: Salt spray