Low pressure test

The low-pressure test is to put the test sample into the test box (room), then reduce the air pressure in the box (room) to the value specified by the relevant standards, and maintain the test for the specified duration. Low-pressure testing is widely used in aviation, aerospace, information, electronics and other fields. Its purpose is mainly to determine the adaptability of components, equipment or other products to low-pressure environments during storage, transportation and use. Usually high and low temperature environments combined with low air pressure constitute a comprehensive environmental stress to evaluate the failure mechanism of products, etc.
Zhongke Testing Environmental Reliability Experiment Center has various climate environment simulation test equipment and low-pressure test capabilities, providing professional low-pressure test services for various types of automobiles and aerospace products, electronic and electrical components, communication products and other products.

1. Components, structural parts, components and complete machines of automobile and aerospace products;
2. Electronic and electrical components, communication products, PCB, PCBA, instruments, household appliances, etc.

GB/T2423.21-2008 Environmental testing of electrical and electronic products Part 2: Test method Test M: Low pressure
GB/T2423.24-1995 Environmental test temperature (low temperature, high temperature) and low pressure vibration (sinusoidal) comprehensive test guidelines for electrical and electronic products
IEC68-2-41 Basic Environmental Test Procedures Part 2 Test Test Z/BM High Temperature/Low Pressure Test
HB5830.14 Airborne equipment environmental conditions and test methods low air pressure (altitude)
JB3224-83 Low pressure test method for electrical products used in high altitude areas
GB/T4857.13 Low pressure test method for packaging and transportation packages
GB12085.5 Environmental test methods for optics and optical instruments integrated low temperature and low pressure
GB/T10590 Low temperature and low pressure test chamber technical conditions
GB/T5170.10 Basic parameter verification method for environmental testing equipment for electrical and electronic products High and low temperature and low pressure testing equipment
GB/T 4857.13-2005 Packaging Basic tests for transport packages Part 13: Low pressure test method
QJ 1238.18-1990 Test method for cables on missile launch vehicles Low pressure test
0 DZ 0039.10-1992 Basic environmental test conditions and methods for geological instrument products Low pressure test
1 GB/T 5170.10-2017 Environmental test equipment inspection methods Part 10: High, low and low pressure test equipment
2 GB/T 2423.27-2020 Environmental testing Part 2: Test methods Test methods and guidelines: Temperature/low pressure or temperature/humidity/low pressure comprehensive test
3 GB/T 2424.15-2008 Environmental testing of electrical and electronic products Temperature/low pressure comprehensive test guidelines
4 GB/T 4937.2-2006 Semiconductor devices - Mechanical and climatic test methods - Part 2: Low pressure
5 GB/T 2423.63-2019 Environmental Test Part 2: Test Method Test: Temperature (low temperature, high temperature)/low pressure/vibration (mixed mode) comprehensive
6 GB/T 2423.21-2008 Environmental test procedures for electrical and electronic products Part 2: Test methods Test M: Low pressure
7 GB/T 12085.5-2010 Optics and optical instruments Environmental test methods Part 5: Low temperature and low pressure comprehensive test
8 GB/T 2423.102-2008 Environmental testing of electrical and electronic products Part 2: Test methods Test: Temperature (low temperature, high temperature)/low pressure/vibration (sinusoidal) comprehensive
9 GB/T 2423.59-2008 Environmental testing of electrical and electronic products Part 2: Test method Test Z/ABMFh: Temperature (low temperature, high temperature)/low pressure/vibration (random) comprehensive
0 GB/T 5170.17-2005 Environmental testing equipment for electrical and electronic products Basic parameter verification method Low temperature/low pressure/humid heat comprehensive sequential testing equipment