1 can directly observe the microstructure of the sample surface. The sample preparation process is simple, there is no restriction on the shape of the sample, and rough surfaces can also be directly observed;
2 samples have a very large degree of freedom in moving in the sample chamber, and can be translated and rotated in three-dimensional space, which makes it convenient to observe details of various areas of irregularly shaped samples;
3 images are full of three-dimensionality. The depth of field of a scanning electron microscope is hundreds of times that of an optical microscope and dozens of times that of a transmission electron microscope, so the resulting image has a stronger three-dimensional sense;
4 has a wide magnification range, which is continuously adjustable from a few times to hundreds of thousands of times. The resolution is also relatively high, between the optical microscope and the transmission electron microscope; the
5 electron beam causes less damage and contamination to the sample. Since the electron beam of the scanning electron microscope is small and does not illuminate the sample surface at a fixed point, but in a raster scanning manner, the degree of damage and contamination to the sample is relatively small; while
6 observes the microscopic morphology of the sample, it can also use other physical signals emitted from the sample for corresponding analysis, such as micro-region component analysis. If heating, cooling, bending, stretching and other accessories are installed in the sample chamber, dynamic changes such as phase change and fracture can be observed.
